Test Data Generation for Product Lines - A Mutation Testing Approach
Zoë Stephenson, Yuan Zhan, John McDermid
Presented at Software Product Line Testing Workshop, Software Product Line Conference, Boston, Massachussetts, August 2004. Proceedings published as AVAYA Labs report ALR-2004-031, Birgit Geppert, Charles Kruger, J. Jenny Li, eds.
Modern product lines typically generate large and complex software products. There is an associated cost increase from the need to test such products, especially for a safety-critical embedded system. We propose a method by which characteristics of the product line can be used as a way of reducing the test data search space and providing effective test data for relevant testing problems. We illustrate this with a solution to the problem of checking that a generated instance is a correct reflection of the required behaviour.